Elimination of Second Surface Reflections in a UV-Vis-nir Reflectance Measurement

Whenever one makes a reflectance measurement of a sample on a substrate or a transparent sample, there is a possibility of the second surface reflection being included in the measurement. This inclusion into the measurement results in an inaccurate measurement of the sample. There are several ways to eliminate the second surface reflection from being measure and they will be examined in both principle and demonstration during this presentation.